Transistor mismatch properties in deep-submicrometer CMOS technologies
- Xiaobin Yuan
- Takashi Shimizu
- et al.
- 2011
- IEEE T-ED
Publications
4 results for Daniel G. Tekleab
Modeling and analysis of parasitic resistance in double-gate FinFETs
- Daniel Tekleab
- S. Samavedam
- et al.
- 2009
- IEEE Transactions on Electron Devices
Modeling and analysis of parasitic resistance in double gate FinFETs
- D. Tekleab
- P. Zeitzof
- 2008
- IEEE International SOI Conference 2008
A cost effective 32nm high-K/metal gate CMOS technology for low power applications with single-metal/gate-first process
- X. Chen
- S. Samavedam
- et al.
- 2008
- VLSI Technology 2008