Techniques for Small-Signal Analysis of Semiconductor Devices
- Steven E. Laux
- 1985
- IEEE TCADIS
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88 results for S.E. Laux
IIIB-2 Channel Length Characterization of LDD MOSFET's-
- Jack Y. C. Sun
- Matthew R. Wordeman
- et al.
- 1985
- IEEE T-ED
A General Control-Volume Formulation for Modeling Impact Ionization in Semiconductor Transport
- Steven E. Laux
- Bertrand M. Grossman
- 1985
- IEEE T-ED
Geometry Effects in MOSFET Channel Length Extraction Algorithms
- M.R. Wordeman
- J.Y.-C. Sun
- et al.
- 1985
- IEEE Electron Device Letters
Techniques for Small-Signal Analysis of Semiconductor Devices
- Steven E. Laux
- 1985
- IEEE T-ED
STUDY OF AVALANCHE BREAKDOWN IN SCALED N-MOSFETS.
- S.E. Laux
- F.H. Gaensslen
- 1983
- IEDM 1983
Accuracy of an Effective Channel Length/External Resistance Extraction Algorithm for MOSFET's
- Steven E. Laux
- 1984
- IEEE T-ED
Effective barrier heights of mixed phase contacts: Size effects
- J. Freeouf
- T.N. Jackson
- et al.
- 1982
- Applied Physics Letters