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75 results for Christopher P. D’Emic

Nitrogen interface engineering in Al ₂O ₃ capacitors for improved thermal stability
- - P.D. Kirsch
  - D.-G. Park
  - et al.
- 2004
- Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
Thermally robust dual-work function ALD-MN _x MOSFETs using conventional CMOS process flow
- - D.-G. Park
  - Z. Luo
  - et al.
- 2004
- VLSI Technology 2004
Systematic study of pFET V_t with Hf-based gate stacks with poly-Si and FUSI gates
- - E. Cartier
  - V. Narayanan
  - et al.
- 2004
- VLSI Technology 2004
Negative bias-temperature instabilities in metal-oxide-silicon devices with SiO ₂ and SiO _xN _y/HfO ₂ gate dielectrics
- - X.J. Zhou
  - L. Tsetseris
  - et al.
- 2004
- Applied Physics Letters
Universal tunneling behavior in technologically relevant P/N junction diodes
- - Paul M. Solomon
  - Jason Jopling
  - et al.
- 2004
- Journal of Applied Physics
Interface trapping properties of nMOSFETs with Al₂O ₃/SiO_xN_y/Si(1 0 0) gate dielectric stacks after exposure to ionizing radiation
- - J.A. Felix
  - H.D. Xiong
  - et al.
- 2003
- INFOS 2003
Charge trapping and detrapping in HfO₂ high-κ gate stacks
- - E. Gusev
  - C. D'Emic
  - et al.
- 2003
- INFOS 2003
Self-Aligned n-Channel Germanium MOSFETs With a Thin Ge Oxynitride Gate Dielectric and Tungsten Gate
- - Hulling Shang
  - Kam-Leung Lee
  - et al.
- 2004
- IEEE Electron Device Letters
Asymmetric Energy Distribution of Interface Traps in n- and p-MOSFETs with HfO₂ Gate Dielectric on Ultrathin SiON Buffer Layer
- - J.-P. Han
  - E.M. Vogel
  - et al.
- 2004
- IEEE Electron Device Letters
Charge detrapping in HfO ₂ high-κ gate dielectric stacks
- - E. Gusev
  - C. D'Emic
- 2003
- Applied Physics Letters