Near-Surface Damage and Contamination after CF4/H2 Reactive Ion Etching of Si
- G.S. Oehrlein
- R.M. Tromp
- et al.
- 2019
- JES
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226 results for Rudolf M. Tromp
Quantifying work function differences using low-energy electron microscopy: The case of mixed-terminated strontium titanate
- J. Jobst
- Laurens M. Boers
- et al.
- 2019
- Ultramicroscopy
Measuring chromatic aberration in LEEM/PEEM
- Rudolf M. Tromp
- 2019
- Ultramicroscopy
Intrinsic stacking domains in graphene on silicon carbide: A pathway for intercalation
- T. A. de Jong
- E. E. Krasovskii
- et al.
- 2018
- Physical Review Materials
Electrical transport across grain boundaries in graphene monolayers on SiC(0001)
- Xiaodong Zhou
- Shuai-Hua Ji
- et al.
- 2018
- 2D Materials
Reprint of Low-energy electron potentiometry
- J. Jobst
- Jaap Kautz
- et al.
- 2017
- Ultramicroscopy
Space charge effects and aberrations on electron pulse compression in a spherical electrostatic capacitor
- Lei Yu
- Haibo Li
- et al.
- 2017
- Ultramicroscopy
Defocus in cathode lens instruments
- Rudolf M. Tromp
- M.S. Altman
- 2017
- Ultramicroscopy
Low-energy electron potentiometry
- J. Jobst
- Jaap Kautz
- et al.
- 2017
- Ultramicroscopy
Design and commissioning of an aberration-corrected ultrafast spin-polarized low energy electron microscope with multiple electron sources
- Weishi Wan
- Lei Yu
- et al.
- 2017
- Ultramicroscopy