Criticality of low-energy protons in single-event effects testing of highly-scaled technologies
- Jonathan A. Pellish
- Paul W. Marshall
- et al.
- 2014
- IEEE TNS
Publications
6 results for Hak S. Kim
32 and 45 nm radiation-hardened-by-design (RHBD) SOI latches
- Kenneth P. Rodbell
- David F. Heidel
- et al.
- 2011
- IEEE TNS
Recent single event effects compendium of candidate electronics for NASA space systems
- Martha V. O'Bryan
- Kenneth A. LaBel
- et al.
- 2011
- REDW/NSREC 2011
Heavy ion testing with iron at 1 GeV/amu
- Jonathan A. Pellish
- Michael A. Xapsos
- et al.
- 2010
- IEEE TNS
Heavy ion testing at the galactic cosmic ray energy peak
- Jonathan A. Pellish
- Michael A. Xapsos
- et al.
- 2009
- RADECS 2009
Proton radiation response of SiGe HBT analog and RF circuits and passives
- John D. Cressler
- Michael C. Hamilton
- et al.
- 2001
- IEEE TNS