Publications

18 results for P.E. Dodd

Heavy ion testing at the galactic cosmic ray energy peak
- - Jonathan A. Pellish
  - Michael A. Xapsos
  - et al.
- 2009
- RADECS 2009
Estimation of heavy-ion LET thresholds in advanced SOI IC technologies from two-photon absorption laser measurements
- - James R. Schwank
  - Marty R. Shaneyfelt
  - et al.
- 2009
- RADECS 2009
Low energy proton single-event-upset test results on 65 nm SOI SRAM
- - David F. Heidel
  - Paul W. Marshall
  - et al.
- 2008
- IEEE TNS
Charge trapping and annealing in high-k gate dielectrics
- - James A. Felix
  - Marty R. Shaneyfelt
  - et al.
- 2004
- IEEE TNS
Radiation-Induced Charge Trapping in Thin Al₂O ₃/SiO_xN_y/Si(100) Gate Dielectric Stacks
- - J.A. Felix
  - M.R. Shaneyfelt
  - et al.
- 2003
- IEEE TNS
Demonstration of npn InAs bipolar transistors with inverted base doping
- - Paul E. Dodd
  - Michael L. Lovejoy
  - et al.
- 1996
- IEEE Electron Device Letters
InAs bipolar transistors: A path to high-performance cryogenic electronics
- - P.E. Dodd
  - M.R. Melloch
  - et al.
- 1993
- Device Research Conference 1993
VIA-7 In As Bipolar Transistors: A Path to High-Performance Cryogenic Electronics
- - P.E. Dodd
  - M.R. Melloch
  - et al.
- 1993
- IEEE Transactions on Electron Devices