Analytical determination of participation in superconducting coplanar architectures
- 2018
- IEEE T-MTT
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116 results for Conal Murray
Effects of strain energy on the recrystallization within narrow metallization
- 2018
- Journal of Applied Physics
Quantification of local strain distributions in nanoscale strained SiGe FinFET structures
- Shogo Mochizuki
- Conal E. Murray
- et al.
- 2017
- Journal of Applied Physics
The Role of Sample Geometry on Ultra-Low Alpha Particle Emissivity Measurements
- Michael S. Gordon
- Ken Rodbell
- et al.
- 2017
- IEEE TNS
Tailoring capping layers to reduce stress gradients in copper metallization
- Conal E. Murray
- Deepika Priyadarshini
- et al.
- 2016
- Applied Physics Letters
Measurements of radioactive contaminants in semiconductor materials
- Michael S. Gordon
- Ken Rodbell
- et al.
- 2016
- Semiconductor Science and Technology
Prediction of recrystallization times in electroplated copper thin films
- Mikhail Treger
- C. Witt
- et al.
- 2016
- Thin Solid Films
Predicting substrate resonance mode frequency shifts using conductive, through-substrate vias
- 2016
- Applied Physics Letters
The Role of Static Charge in Ultra-Low Alpha Particle Emissivity Measurements
- Michael. S. Gordon
- Kenneth P. Rodbell
- et al.
- 2015
- IEEE TNS
Efficient modeling of Bragg coherent x-ray nanobeam diffraction
- Stephan O. Hruszkewycz
- Martin V. Holt
- et al.
- 2015
- Optics Letters