Characterization of silicate/Si(001) interfaces
- M. Copel
- E. Cartier
- et al.
- 2002
- Applied Physics Letters
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182 results for Eduard Cartier
Measurement of barrier heights in high permittivity gate dielectric films
- S. Zafar
- E. Cartier
- et al.
- 2002
- Applied Physics Letters
Physical and electrical characterization of Hafnium oxide and Hafnium silicate sputtered films
- A.C. Callegari
- E. Cartier
- et al.
- 2001
- Journal of Applied Physics
Effective electron mobility in Si inversion layers in metal-oxide-semiconductor systems with a high-κ insulator: The role of remote phonon scattering
- Massimo V. Fischetti
- Deborah A. Neumayer
- et al.
- 2001
- Journal of Applied Physics
Materials characterization of Zro2-SiO2 and HfO2-SiO2 binary oxides deposited by chemical solution deposition
- D. Neumayer
- E. Cartier
- 2001
- Journal of Applied Physics
High-quality aluminum oxide gate dielectrics by ultra-high-vacuum reactive atomic-beam deposition
- S. Guha
- E. Cartier
- et al.
- 2001
- Journal of Applied Physics
Molecular-beam-deposited yttrium-oxide dielectrics in aluminum-gated metal-oxide-semiconductor field-effect transistors: Effective electron mobility
- L.Å. Ragnarsson
- S. Guha
- et al.
- 2001
- Applied Physics Letters
Imaging of trapped charge in SiO2 and at the SiO2-Si interface
- R. Ludeke
- E. Cartier
- 2001
- Applied Physics Letters
Interface studies of tungsten gate metal-oxide-silicon capacitors
- Huiling Shang
- Marvin H. White
- et al.
- 2001
- Applied Physics Letters
Robustness of ultrathin aluminum oxide dielectrics on Si(001)
- M. Copel
- E. Cartier
- et al.
- 2001
- Applied Physics Letters