Test Generation Methods for Utilization Improvement of Hardware-Accelerated Simulation Platforms
- Wisam Kadry
- Dimtry Krestyashyn
- et al.
- 2017
- IEEE Design and Test
Paper
Publications
9 results for Arkadiy Morgenshtein
Probabilistic bug-masking analysis for post-silicon tests in microprocessor verification
- Doowon Leey
- Tom Kolan
- et al.
- 2016
- DAC 2016
Conference paperComparative study of test generation methods for simulation accelerators
- Wisam Kadry
- Dimtry Krestyashyn
- et al.
- 2015
- DATE 2015
Conference paperEffective post-silicon failure localization using dynamic program slicing
- Ophir Friedler
- Wisam Kadry
- et al.
- 2014
- DATE 2014
Conference paperLogic Gates as Repeaters (LGR) for area-efficient timing optimization
- Michael Moreinis
- Arkadiy Morgenshtein
- et al.
- 2006
- IEEE Transactions on VLSI Systems
PaperRepeater Insertion combined with LGR methodology for on-chip interconnect timing optimization
- Michael Moreinis
- Arkadiy Morgenshtein
- et al.
- 2004
- ICECS 2004
Conference paperAn efficient implementation of D-FLIP-FLOP using the GDI technique
- Arkadiy Morgenshtein
- Alexander Fish
- et al.
- 2004
- ISCAS 2004
Conference paperGate-diffusion input (GDI): A power-efficient method for digital combinatorial circuits
- Arkadiy Morgenshtein
- Alexander Fish
- et al.
- 2002
- IEEE Transactions on VLSI Systems
PaperGate-diffusion input (GDI) - A technique for low power design of digital circuits: Analysis and characterization
- Arkadiy Morgenshtein
- Alexander Fish
- et al.
- 2002
- Proceedings - IEEE International Symposium on Circuits and Systems
Paper