Publications

8 results for Borivoje Nikolíc

A 225 μm2 probe single-point calibration digital temperature sensor using body-bias adjustment in 28 nm FD-SOI CMOS
- - Martin Cochet
  - Ben Keller
  - et al.
- 2018
- IEEE SSC-L
Technology variability from a design perspective
- - Borivoje Nikolić
  - Ji-Hoon Park
  - et al.
- 2011
- IEEE TCAS-I
SRAM stability characterization using tunable ring oscillators in 45nm CMOS
- - Jason Tsai
  - Seng Oon Toh
  - et al.
- 2010
- ISSCC 2010
Fixed- and variable-length ring oscillators for variability characterization in 45nm CMOS
- - Ji-Hoon Park
  - Liang-Teck Pang
  - et al.
- 2009
- CICC 2009
Large-scale SRAM variability characterization in 45 nm CMOS
- - Zheng Guo
  - Andrew Carlson
  - et al.
- 2009
- IEEE Journal of Solid-State Circuits
Measurement and analysis of variability in 45 nm strained-Si CMOS technology
- - Liang-Teck Pang
  - Kun Qian
  - et al.
- 2009
- IEEE Journal of Solid-State Circuits
Parameter-specific electronic measurement and analysis of sources of variation using ring oscillators
- - Lynn T.-N. Wang
  - Liang-Teck Panga
  - et al.
- 2009
- SPIE Advanced Lithography 2009
Measurements and analysis of process variability in 90 nm CMOS
- - Liang-Teck Pang
  - Borivoje Nikolić
- 2009
- IEEE Journal of Solid-State Circuits