Simple model for time-dependent dielectric breakdown in inter- and intralevel low- k dielectrics
- J.R. Lloyd
- E. Liniger
- et al.
- 2005
- Journal of Applied Physics
Publications
148 results for Thomas M. Shaw
Issues in the Processing of Cuprate Ceramic Superconductors
- David R. Clarke
- Thomas M. Shaw
- et al.
- 2005
- JACerS
Detection of open or closed porosity in low-κ dielectrics by solvent diffusion
- Marcus A. Worsley
- Mark Roberts
- et al.
- 2005
- Microelectronic Engineering
Liquid Redistribution during Liquid‐Phase Sintering
- T.M. SHAW
- 2005
- JACerS
Forces between Aluminum Oxide Grains in a Silicate Melt and Their Effect on Grain Boundary Wetting
- Thomas M. Shaw
- Peter R. Duncombe
- 2005
- JACerS
Preparation and Sintering of Homogeneous Silicon Nitride Green Compacts
- T.M. SHAW
- B.A. PETHICA
- 2005
- JACerS
Electromigration and adhesion
- James R. Lloyd
- Michael W. Lane
- et al.
- 2005
- IEEE T-DMR
Evaluation of high‐resolution electron microscopy as a method for studying Y‐Ba‐Cu‐O superconductors
- William Krakow
- Thomas M. Shaw
- 2005
- Journal of Electron Microscopy Technique
Low-k BEOL mechanical modeling
- Xiao Hu Liu
- Michael W. Lane
- et al.
- 2004
- ADMETA 2004
Chip-to-Package Interaction for a 90 nm Cu / PECVD Low-k technology
- W. Landers
- D. Edelstein
- et al.
- 2004
- IITC 2004