Publications

30 results for Saibal Mukhopadhyay

Estimation of gate-to-channel tunneling current in ultra-thin oxide sub-50 nm double gate devices
- - Saibal Mukhopadhyay
  - Keunwoo Kim
  - et al.
- 2007
- Microelectronics Journal
Design of a process variation tolerant self-repairing SRAM for yield enhancement in nanoscaled CMOS
- - Saibal Mukhopadhyay
  - Keejong Kim
  - et al.
- 2007
- IEEE Journal of Solid-State Circuits
Device-optimization technique for robust and low-power FinFET SRAM design in NanoScale era
- - Aditya Bansal
  - Saibal Mukhopadhyay
  - et al.
- 2007
- IEEE Transactions on Electron Devices
Statistical characterization and on-chip measurement methods for local random variability of a process using sense-amplifier-based test structure
- - Saibal Mukhopadhyay
  - Keunwoo Kim
  - et al.
- 2007
- ISSCC 2007
Modeling and analysis of leakage currents in double-gate technologies
- - Saibal Mukhopadhyay
  - Keunwoo Kim
  - et al.
- 2006
- IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Optimal UTB FD/SOI device structure using thin BOX for sub-50-nm SRAM design
- - Saibal Mukhopadhyay
  - Keunwoo Kim
  - et al.
- 2006
- IEEE Electron Device Letters
Modeling and analysis of gate leakage in ultra-thin oxide sub-50nm double gate devices and circuits
- - Saibal Mukhopadhyay
  - Keunwoo Kim
  - et al.
- 2005
- ISQED 2005
Modeling and analysis of total leakage currents in nanoscale double gate devices and circuits
- - Saibal Mukhopadhyay
  - Keunwoo Kim
  - et al.
- 2005
- ISLPED 2005
A forward body-biased low-leakage SRAM cache: Device, circuit and architecture considerations
- - Chris Hyung-Il Kim
  - Jae-Joon Kim
  - et al.
- 2005
- IEEE Transactions on VLSI Systems
Variability analysis for sub-100 nm PD/SOI CMOS SRAM cell
- - Rajiv V. Joshi
  - Saibal Mukhopadhyay
  - et al.
- 2004
- ESSCIRC 2004