Securing IoT Devices Using Dynamic Power Management: Machine Learning Approach
- Nikhil Chawla
- Arvind Singh
- et al.
- 2021
- IEEE IoT Journal
Paper
Publications
30 results for Saibal Mukhopadhyay
A simulation study of oxygen vacancy-induced variability in HfO 2/metal gated SOI FinFET
- Amit Ranjan Trivedi
- Takashi Ando
- et al.
- 2014
- IEEE T-ED
PaperImpact of die-to-die thermal coupling on the electrical characteristics of 3D stacked SRAM cache
- Subho Chatterjee
- Minki Cho
- et al.
- 2012
- SEMI-THERM 2012
Conference paperReliability monitoring ring oscillator structures for isolated/combined NBTI and PBTI measurement in high-k metal gate technologies
- Jae-Joon Kim
- Barry P. Linder
- et al.
- 2011
- IRPS 2011
Conference paperSRAM write-ability improvement with transient negative bit-line voltage
- Saibal Mukhopadhyay
- Rahul M. Rao
- et al.
- 2011
- IEEE Transactions on VLSI Systems
PaperSelf-repairing SRAM using on-chip detection and compensation
- Niladri Narayan Mojumder
- Saibal Mukhopadhyay
- et al.
- 2010
- IEEE Transactions on VLSI Systems
PaperYield estimation of SRAM circuits using "Virtual SRAM Fab"
- Aditya Bansal
- Rama N. Singh
- et al.
- 2009
- ICCAD 2009
Conference paperDesign of sub-90 nm low-power and variation tolerant PD/SOI SRAM cell based on dynamic stability metrics
- Rajiv V. Joshi
- Saibal Mukhopadhyay
- et al.
- 2009
- IEEE Journal of Solid-State Circuits
PaperPre-Si estimation and compensation of SRAM layout deficiencies to achieve target performance and yield
- Aditya Bansal
- Rama N. Singh
- et al.
- 2008
- ICCD 2008
Conference paperRing oscillator circuit structures for measurement of isolated NBTI/PBTI effects
- Jae-Joon Kim
- Rahul Rao
- et al.
- 2008
- ICICDT 2008
Conference paper