Cross-Process Defect Attribution using Potential Loss Analysis
- Ide-San Ide
- Kohei Miyaguchi
- 2025
- WSC 2025
Conference paper
Publications
16 results for Kohei Miyaguchi
Impact of Lot Arrival Density Fluctuations on Cycle Time Control IE: Industrial Engineering
- Masao Joko
- Kohei Miyaguchi
- et al.
- 2025
- ASMC 2025
Conference paperSequence-Aware Inline Measurement Attribution for Good-Bad Wafer Diagnosis DM: Big Data Management and Machine Learning
- Kohei Miyaguchi
- Masao Joko
- et al.
- 2025
- ASMC 2025
Conference paperSequence-Aware Inline Measurement Attribution for Good-Bad Wafer Diagnosis
- Kohei Miyaguchi
- Masao Joko
- et al.
- 2025
- ASMC 2025
Conference paperWafer Defect Root Cause Analysis with Partial Trajectory Regression
- Kohei Miyaguchi
- Masao Joko
- et al.
- 2025
- ASMC 2025
Conference paperWafer Defect Root Cause Analysis with Partial Trajectory Regression DM: Big Data Management and Machine Learning
- Kohei Miyaguchi
- Masao Joko
- et al.
- 2025
- ASMC 2025
Conference paperMolecular Descriptor for Global Relationship of intra-Molecular Substructures
- Lisa Hamada
- Akihiro Kishimoto
- et al.
- 2024
- MRS Fall Meeting 2024
Conference paperBiases in Evaluation of Molecular Optimization Methods and Bias Reduction Strategies
- Hiroshi Kajino
- Kohei Miyaguchi
- et al.
- 2023
- ICML 2023
Conference paperDetection of Unobserved Common Cause in Discrete Data Based on the MDL Principle
- Masatoshi Kobayashi
- Kohei Miyaguchi
- et al.
- 2022
- Big Data 2022
Conference paperHierarchical Lattice Layer for Partially Monotone Neural Networks
- Hiroki Yanagisawa
- Kohei Miyaguchi
- et al.
- 2022
- NeurIPS 2022
Conference paper