A New Dynamic Beta-Ratio Circuit Technique for Strained-Si Technology
- Rajiv V. Joshi
- Keunwoo Kim
- et al.
- 2003
- IEEE International SOI Conference 2003
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210 results for Rajiv V. Joshi
FinFET Technology for Future Microprocessors
- T. Ludwig
- I. Aller
- et al.
- 2003
- IEEE International SOI Conference 2003
Oxide breakdown model and its impact on SRAM cell functionality
- R. Rodríguez
- R.V. Joshi
- et al.
- 2003
- SISPAD 2003
Influence and model of gate oxide breakdown on CMOS inverters
- R. Rodríguez
- J.H. Stathis
- et al.
- 2003
- Microelectronics Reliability
New Optimal Design Strategies and Analysis of Ultra-Low Leakage Circuits for Nano-Scale SOI Technology
- Koushik K. Das
- Rajiv V. Joshi
- et al.
- 2003
- ISLPED 2003
Strained-Si devices and circuits for low-power applications
- Keunwoo Kim
- R.V. Joshi
- et al.
- 2003
- ISLPED 2003
New optimal design strategies and analysis of ultra-low leakage circuits for nano-scale SOI technology
- K. Das
- R.V. Joshi
- et al.
- 2003
- ISLPED 2003
Strained-Si Devices and Circuits for Low-Power Applications
- Keunwoo Kim
- Rajiv V. Joshi
- et al.
- 2003
- ISLPED 2003
Design considerations of scaled sub-0.1 μm PD/SOI CMOS circuits
- C.T. Chuang
- R.V. Joshi
- et al.
- 2003
- ISQED 2003
Performance assessment of scaled strained-Si channel-on-insulator (SSOI) CMOS
- Keunwoo Kim
- Ching-Te Chuang
- et al.
- 2002
- IEEE International SOI Conference 2002