Transmission electron microscopy investigations of defects in molecular beam epitaxy-grown oxide films
- E.J. Williams
- A. Daridon
- et al.
- 1997
- Journal of Alloys and Compounds
Paper
Publications
8 results for Ø. Fischer
3D-XY critical behavior in La2-xSrxCuO4 thin films probed by penetration depth measurement
- Y. Jaccard
- T. Schneider
- et al.
- 1996
- Czechoslovak Journal of Physics
PaperVortex lattice dynamics multilayers
- L. Miéville
- E. Koller
- et al.
- 1996
- Physical Review B - CMMP
PaperVariation of the in-plane penetration depth as a function of doping thin films on: Implications for the overdoped state
- J.P. Locquet
- Y. Jaccard
- et al.
- 1996
- Physical Review B - CMMP
PaperEvidence of 3D-XY critical behaviour in La2-xSrxCuO4 films
- Y. Jaccard
- T. Schneider
- et al.
- 1996
- Europhysics Letters
PaperStrontium concentration dependence of the in-plane penetration depth of superconducting La2-xSrxCuO4±δ very thin films
- Y. Jaccard
- A. Cretton
- et al.
- 1994
- Physica C: Superconductivity and its applications
PaperThe problem of Sr doping and interface abruptness in La2-xSrxCuO4 multilayers; the application of transmission electron microscopy
- E.J. Williams
- A. Cretton
- et al.
- 1994
- Physica C: Superconductivity and its applications
PaperLa2-xSrxCuO4 thin films and multilayers prepared by MBE
- A. Cretton
- Y. Jaccard
- et al.
- 1994
- Physica C: Superconductivity and its applications
Paper