A. Gupta, R. Gross, et al.
SPIE Advances in Semiconductors and Superconductors 1990
Paper
The problem of Sr doping and interface abruptness in La2-xSrxCuO4 multilayers; the application of transmission electron microscopy
Abstract
This represents an attempt to use the local investigative properties of transmission electron microscopy to examine the content and distribution of strontium in La2-xSrxCuO4 thin films grown by molecular beam epitaxy on (001) strontium titanate substrates. © 1994.
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