Publications

5 results for Munehiro Yoshida

Flexible test mode approach for 256-Mb DRAM
- - Toshiaki Kirihata
  - Hing Wong
  - et al.
- 1997
- IEEE Journal of Solid-State Circuits
Flexible test mode design for DRAM characterization
- - H. Wong
  - T. Kirihata
  - et al.
- 1996
- VLSI Circuits 1996
Fault-tolerant designs for 256 Mb DRAM
- - Toshiaki Kirihata
  - Yohji Watanabe
  - et al.
- 1996
- IEEE Journal of Solid-State Circuits
A 286 mm² 256 Mb DRAM with ×32 both-ends DQ
- - Yohji Watanabe
  - Hing Wong
  - et al.
- 1996
- IEICE Transactions on Electronics
Fault-tolerant designs for 256 Mb DRAM
- - Toshiaki Kirihata
  - Yohji Watanabe
  - et al.
- 1996
- IEICE Transactions on Electronics