Publications

3 results for Chanhee Oh

Impact of stress-induced backflow on full-chip electromigration risk assessment
- - Haldun Haznedar
  - Martin Gall
  - et al.
- 2006
- IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Postroute gate sizing for crosstalk noise reduction
- - Murat R. Becer
  - David Blaauw
  - et al.
- 2004
- IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Delay noise pessimism reduction by logic correlations
- - A. Glebov
  - S. Gavrilov
  - et al.
- 2004
- ICCAD 2004