Publications

2 results for R.Q. Williams

V_DD scaling for FinFET logic and memory circuits: The impact of process variations and SRAM stability
- - C.-H. Lin
  - K. Das
  - et al.
- 2006
- VLSI-TSA 2006
Conference paper
Compact modeling of FinFETs featuring independent-gate operation mode
- - C.-H. Lin
  - X. Xi
  - et al.
- 2005
- VLSI Technology 2005
Conference paper