Publications

3 results for Cristina Plettner

Latch design techniques for mitigating single event upsets in 65 nm SOI device technology
- - A.J. KleinOsowski
  - Ethan H. Cannon
  - et al.
- 2007
- IEEE TNS
Protecting big blue from rogue subatomic particles
- - Ethan H. Cannon
  - A.J. KleinOsowski
  - et al.
- 2007
- ICICDT 2007
Single-event-upset critical charge measurements and modeling of 65 nm silicon-on-insulator latches and memory cells
- - David F. Heidel
  - Kenneth P. Rodbell
  - et al.
- 2006
- IEEE TNS