Capacitance investigation of diodes and SCRs for ESD protection of high frequency circuits in sub-100nm bulk CMOS technologiesJunjun LiRobert Gauthieret al.2007EOS/ESD 2007
Failure analysis of I/O with ESD protection devices in advanced CMOS technologiesMujahid MuhammadRobert Gauthieret al.2007IPFA 2007
Analysis of failure mechanism on gate-silicided and gate-non-silicided, drain/source silicide-blocked ESD NMOSFETs in a 65nm bulk CMOS technologyJunjun LiDavid Alvarezet al.2006IPFA 2006
Design and characterization of a multi-rc-triggered MOSFET-based power clamp for on-chip ESD protectionJunjun LiRobert Gauthieret al.2006EOS/ESD 2006