How detrimental could a via be?Lei ShanYoung Kwarket al.2004IEEE Topical Meeting EPEPS 2004Conference paper
Silicon-on-insulator dynamic threshold ESD networks and active clamp circuitryS. VoldmanD. Huiet al.2002Journal of ElectrostaticsPaper
Silicon-on-insulator dynamic threshold ESD networks and active clamp circuitryS. VoldmanD. Huiet al.2000EOS/ESD 2000Conference paper