How detrimental could a via be?
- Lei Shan
- Young Kwark
- et al.
- 2004
- IEEE Topical Meeting EPEPS 2004
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23 results for Daniel Dreps
Silicon-on-insulator dynamic threshold ESD networks and active clamp circuitry
- S. Voldman
- D. Hui
- et al.
- 2002
- Journal of Electrostatics
Silicon-on-insulator dynamic threshold ESD networks and active clamp circuitry
- S. Voldman
- D. Hui
- et al.
- 2000
- EOS/ESD 2000