High-Resolution Capacitance Measurement By Force Microscopy: Application To Sample Characterization And Potentiometry
- David W. Abraham
- Yves Martin
- et al.
- 1989
- Proceedings of SPIE 1989
Publications
56 results for Yves Martin
High‐resolution magnetic imaging by force microscopy (invited) (abstract)
- H.K. Wickramasinghe
- Y. Martin
- 1988
- Journal of Applied Physics
High-resolution magnetic imaging of domains in TbFe by force microscopy
- Y. Martin
- D. Rugar
- et al.
- 1988
- Applied Physics Letters
Study of dynamic current distribution in logic circuits by Joule displacement microscopy
- Y. Martin
- H.K. Wickramasinghe
- 1987
- Applied Physics Letters
Magnetic imaging by "force microscopy" with 1000 Å resolution
- Y. Martin
- H.K. Wickramasinghe
- 1987
- Applied Physics Letters
Atomic force microscope-force mapping and profiling on a sub 100-Å scale
- Y. Martin
- C.C. Williams
- et al.
- 1987
- Journal of Applied Physics