C.C. Williams, H.K. Wickramasinghe
Microelectronic Engineering
We describe a new method for imaging magnetic fields with 1000 Å resolution. The technique is based on using a force microscope to measure the magnetic force between a magnetized tip and the scanned surface. The method shows promise for the high-resolution mapping of both static and dynamic magnetic fields.
C.C. Williams, H.K. Wickramasinghe
Microelectronic Engineering
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