Publications

169 results for Jim Stathis

Bias temperature instability in high-κ/metal gate transistors - Gate stack scaling trends
- - Siddarth Krishnan
  - Vijay Narayanan
  - et al.
- 2012
- IRPS 2012
Detailed study of fast transient relaxation of Vt instability in HKMG nFETs
- - K. Zhao
  - James Stathis
  - et al.
- 2012
- IRPS 2012
Min-log approach to modeling dielectric breakdown data
- - Emmanuel Yashchin
  - Baozhen Li
  - et al.
- 2012
- IRPS 2012
A manufacturable dual channel (Si and SiGe) high-k metal gate CMOS technology with multiple oxides for high performance and low power applications
- - S. Krishnan
  - U. Kwon
  - et al.
- 2011
- IEDM 2011
Fundamental aspects of HfO ₂-based high-k metal gate stack reliability and implications on t _inv-scaling
- - E. Cartier
  - Andreas Kerber
  - et al.
- 2011
- IEDM 2011
PBTI/NBTI monitoring ring oscillator circuits with on-chip Vt characterization and high frequency AC stress capability
- - Jae-Joon Kim
  - Rahul M. Rao
  - et al.
- 2011
- VLSI Circuits 2011
Full metal gate with borderless contact for 14 nm and beyond
- - Soon-Cheon Seo
  - L.F. Edge
  - et al.
- 2011
- VLSI Technology 2011
A robust reliability methodology for accurately predicting Bias Temperature Instability induced circuit performance degradation in HKMG CMOS
- - D.P. Ioannou
  - K. Zhao
  - et al.
- 2011
- IRPS 2011
PBTI under dynamic stress: From a single defect point of view
- - K. Zhao
  - J.H. Stathis
  - et al.
- 2011
- IRPS 2011
Analysis of recoverable and non-recoverable NBTI and PBTI using AC and DC stresses
- - Frederic Monsieur
  - Eduard Cartier
  - et al.
- 2011
- IRPS 2011