Control and modification of nematic liquid crystal pretilt angles on polyimides
- Kang-Wook Lee
- Alan Lien
- et al.
- 1997
- Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers
Paper
Publications
169 results for Jim Stathis
Potential fluctuations due to Pb centres at the Si/SiO2 interface
- M.J. Uren
- K.M. Brunson
- et al.
- 1997
- Microelectronic Engineering
PaperOn the relationship between stress induced leakage currents and catastrophic breakdown in ultra-thin SiO2 based dielectrics
- D.A. Buchanan
- J.H. Stathis
- et al.
- 1997
- Microelectronic Engineering
PaperQuantitative model of the thickness dependence of breakdown in ultra-thin oxides
- 1997
- Microelectronic Engineering
PaperElectrically detected magnetic resonance study of stress-induced leakage current in thin SiO2
- 1996
- Applied Physics Letters
PaperConductance measurements on Pb centers at the (111) Si:SiO2 interface
- M.J. Uren
- J.H. Stathis
- et al.
- 1996
- Journal of Applied Physics
PaperHot-electron induced passivation of silicon dangling bonds at the Si(111)/SiO2 interface
- E. Cartier
- J.H. Stathis
- 1996
- Applied Physics Letters
PaperDissociation kinetics of hydrogen-passivated (100) Si/SiO2 interface defects
- 1995
- Journal of Applied Physics
PaperInterface states induced by the presence of trapped holes near the silicon-silicon-dioxide interface
- D.J. DiMaria
- D.A. Buchanan
- et al.
- 1995
- Journal of Applied Physics
PaperElectrically detected magnetic resonance study of stress-induced leakage current in thin SiO2
- 1995
- Applied Physics Letters
Paper