Transistor-limited constant voltage stress of gate dielectrics
- B.P. Linder
- D.J. Frank
- et al.
- 2001
- VLSI Technology 2001
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169 results for Jim Stathis
Calculating the error in long term oxide reliability estimates
- B.P. Linder
- J.H. Stathis
- et al.
- 2001
- IRPS 2001
Physical and predictive models of ultra thin oxide reliability in CMOS devices and circuits
- 2001
- IRPS 2001
Physical and predictive models of ultra thin oxide reliability in CMOS devices and circuits
- 2001
- IRPS 2001
Calculating the error in long term oxide reliability estimates
- B.P. Linder
- J.H. Stathis
- et al.
- 2001
- IRPS 2001
Photoluminescence characterization of defects in thermal oxide
- Hiroyuki Nishikawa
- James H. Stathis
- 1999
- MRS Proceedings 1999
Breakdown measurements of ultra-thin SiO2 at low voltage
- J.H. Stathis
- A. Vayshenker
- et al.
- 2000
- VLSI Technology 2000
Degradation of thin SiO 2 gate oxides by atomic hydrogen
- F. Cartier
- D.J. DiMaria
- et al.
- 1994
- DRC 1994
Laser conditioning and electronic defects of HfO2and SiO2thin films
- M.R. Kozlowski
- M. Staggs
- et al.
- 1990
- SPIE Laser-Induced Damage in Optical Materials 1990
Electron spin resonance spectroscopy of defects in low temperature dielectric films
- D. Jousse
- Jerzy Kanicki
- et al.
- 1989
- Proceedings of SPIE 1989