Single-event-upset and alpha-particle emission rate measurement techniques
- Michael S. Gordon
- Kenneth P. Rodbell
- et al.
- 2008
- IBM J. Res. Dev
Publications
5 results for Daniel D. Reinhardt
The impact of aging effects and manufacturing variation on SRAM soft-error rate
- Ethan H. Cannon
- A.J. KleinOsowski
- et al.
- 2008
- IEEE T-DMR
Protecting big blue from rogue subatomic particles
- Ethan H. Cannon
- A.J. KleinOsowski
- et al.
- 2007
- ICICDT 2007
SRAM SER in 90, 130 and 180 NM bulk and SOI technologies
- Ethan H. Cannon
- Daniel D. Reinhardt
- et al.
- 2004
- IRPS 2004
SRAM ser in 90, 130 and 180 nm bulk and SOI technologies
- Ethan H. Cannon
- Daniel D. Reinhardt
- et al.
- 2004
- IRPS 2004