Time-resolved x-ray scattering studies of layer-by-layer epitaxial growth
- P.H. Fuoss
- D.W. Kisker
- et al.
- 1992
- Physical Review Letters
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17 results for S. Brennan
X-ray depth profiling of iron oxide thin films
- Michael F. Toney
- Ting C. Huang
- et al.
- 2011
- Journal of Materials Research
Silicon-induced faceting of vicinal GaAs(001)
- S. Brennan
- G.B. Stephenson
- et al.
- 2000
- Journal of Applied Physics
Atomic scale studies of epitaxial growth processes using X-ray techniques
- D.W. Kisker
- G.B. Stephenson
- et al.
- 1996
- Journal of Crystal Growth
Optical characterization of surfaces during epitaxial growth using RDS and GIXS
- I. Kamiya
- L. Mantese
- et al.
- 1996
- Journal of Crystal Growth
In-situ X-ray studies of organometallic vapor phase epitaxy growth
- P.H. Fuoss
- D.W. Kisker
- et al.
- 1995
- Materials Science and Engineering B
Characterization of vapor phase growth using X-ray techniques
- D.W. Kisker
- G.B. Stephenson
- et al.
- 1995
- Journal of Crystal Growth
Investigation of the relationship between reflectance difference spectroscopy and surface structure using grazing incidence X‐ray scattering
- D.W. Kisker
- G.B. Stephenson
- et al.
- 1995
- physica status solidi (a)
GaAs c(4×4) surface structure in organometallic vapor-phase epitaxy
- A.P. Payne
- P.H. Fuoss
- et al.
- 1994
- Physical Review B
X-ray-scattering analysis of surface structures produced by vapor-phase epitaxy of GaAs
- F.J. Lamelas
- P.H. Fuoss
- et al.
- 1994
- Physical Review B