On the Very-High-Current Degradations on Si n-p-n Transistors
- Denny Duan-Lee Tang
- Edward Hackbarth
- et al.
- 1990
- IEEE T-ED
Publications
10 results for Edward Hackbarth
The Effects of X-Rays on p-n Junction Leakage Currents
- Denny D. Tang
- Edward Hackbarth
- et al.
- 1989
- IEEE T-ED
Effects of processing conditions on the characteristics of platinum silicide Schottky barrier diodes
- D. Moy
- S. Basavaiah
- et al.
- 1988
- Solid State Electronics
Inherent and Stress-Induced Leakage in Heavily Doped Silicon Junctions
- Edward Hackbarth
- Denny Duan-Lee Tang
- 1988
- IEEE T-ED
Junction Degradation in Bipolar Transistors and the Reliability Imposed Constraints to Scaling and Design
- Denny Duan-Lee Tang
- Edward Hackbarth
- 1988
- IEEE T-ED
Design Considerations of High-Performance Narrow-Emitter Bipolar Transistors
- Denny D. Tang
- Tze-Chiang Chen
- et al.
- 1987
- IEEE Electron Device Letters
Methodology for Bipolar Process Diagnosis and Its Application to Advanced Self-Aligned Bipolar Transistors
- G.P. Li
- E. Hackbarth
- et al.
- 1987
- IEEE T-ED
IVB-1 Tunneling Component in Polysilicon Self-Aligned Bipolar Transistors
- E. Hackbarth
- G.P. Li
- et al.
- 1986
- IEEE T-ED
A 1.0-ns 5-kbit ecl RAM
- Ching-Te Chuang
- Denny D. Tang
- et al.
- 1986
- IEEE Journal of Solid-State Circuits
Sub-400-ps ISL circuits
- Ching-Te Chuang
- G.P. Li
- et al.
- 1986
- IEEE Electron Device Letters