Publications

111 results for F.K. LeGoues

Critique of "atom probe field ion microscopy of the decomposition of Cu-2.7 A/O Co"
- - F.K. LeGoues
  - T.L. McDevitt
  - et al.
- 1986
- Scripta Metallurgica
Interdiffusion and precipitation in Al‒Hf thin-film couples
- - M. Wittmer
  - F. Legoues
  - et al.
- 1986
- Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties
Summary Abstract: High temperature decomposition of SiO₂at the Si/SiO₂ interface
- - G.W. Rubloff
  - R.M. Tromp
  - et al.
- 1986
- JVSTA
NEW TECHNIQUE FOR FAILURE ANALYSIS: CROSS-SECTIONAL TRANSMISSION ELECTRON MICROSCOPY OF DEVICES.
- - F.K. LeGoues
  - P.S. Ho
- 1985
- VMIC 1985
High-temperature SiO2 decomposition at the SiO2/Si interface
- - R.M. Tromp
  - G.W. Rubloff
  - et al.
- 1985
- Physical Review Letters
NiSi mixing: A new model for low temperature silicide formation
- - E.J. Van Loenen
  - J.F. Van Der Veen
  - et al.
- 1985
- Surface Science
Correlation of Schottky-barrier height and microstructure in the epitaxial Ni silicide on Si(111)
- - M. Liehr
  - P.E. Schmid
  - et al.
- 1985
- Physical Review Letters
High resolution studies of NiSi₂ ultrathin film formation by ion scattering and cross-section tem
- - E.J. Van Loenen
  - A.E.M.J. Fischer
  - et al.
- 1985
- Surface Science
Chemical bonding and reaction at metal/polymer interfaces
- - P.S. Ho
  - P.O. Hahn
  - et al.
- 1985
- JVSTA
Chemical reactions at Pt/oxide/Si and Ti/oxide/Si interfaces
- - M. Liehr
  - F.K. LeGoues
  - et al.
- 1985
- JVSTA