Annealing of heavily arsenic-doped silicon: Electrical deactivation and a new defect complex
- K.C. Pandey
- A. Erbil
- et al.
- 1988
- Physical Review Letters
Paper
Publications
4 results for A. Erbil
Total-electron-yield current measurements for near-surface extended x-ray-absorption fine structure
- A. Erbil
- G.S. Cargill Iii
- et al.
- 1988
- Physical Review B
PaperLattice distortions for arsenic in single-crystal silicon
- A. Erbil
- W. Weber
- et al.
- 1986
- Physical Review B
PaperIntercalate structure, melting, and the commensurate-incommensurate transition in bromine-intercalated graphite
- A. Erbil
- A.R. Kortan
- et al.
- 1983
- Physical Review B
Paper