Differential scanning tunnelling microscopy
- David W. Abraham
- C.C. Williams
- et al.
- 2011
- Journal of Microscopy
Publications
18 results for C.C. Williams
High‐resolution force microscopy of in‐plane magnetization
- David W. Abraham
- C.C. Williams
- et al.
- 2011
- Journal of Microscopy
Microscopy of chemical-potential variations on an atomic scale
- C.C. Williams
- H.K. Wickramasinghe
- 1990
- Nature
Lateral dopant profiling on a 100 nm scale by scanning capacitance microscopy
- C.C. Williams
- J. Slinkman
- et al.
- 1990
- Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
Scanning capacitance microscopy on a 25 nm scale
- C.C. Williams
- W.P. Hough
- et al.
- 1989
- Applied Physics Letters
Lateral dopant profiling with 200 nm resolution by scanning capacitance microscopy
- C.C. Williams
- J. Slinkman
- et al.
- 1989
- Applied Physics Letters
Absolute optical ranging with 200-nm resolution
- C.C. Williams
- H.K. Wickramasinghe
- 1989
- Optics Letters
Thermal and photo thermal imaging on a sub 100 nanometer scale
- C.C. Williams
- H.K. Wickramasinghe
- 1988
- SPIE OE/LASE 1988
Atomic force microscope: Implementations
- P.C.D. Hobbs
- Y. Martin
- et al.
- 1989
- Proceedings of SPIE 1989
Measurement of in-plane magnetization by force microscopy
- David W. Abraham
- C.C. Williams
- et al.
- 1988
- Applied Physics Letters