Publications

39 results for Thomas Kwok

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- - Thomas Y. Kwok
  - Michael P. Perrone
- 2001
- ICDAR 2001
Electromigration in metals
- - Paul S Ho
  - Thomas Kwok
- 1999
- Reports on Progress in Physics
Electromigration and current-carrying implications for aluminum-based metallurgy with tungsten stud-via interconnections
- - H.S. Rathore
  - R. Filippi
  - et al.
- 1992
- SPIE Microelectronic Processing 1992
Effect of strain on diffusion kinetics and activation energy for al grain-boundary diffusion: A computer simulation
- - Thomas Kwok
- 1992
- SPIE Microelectronic Processing 1992
Electromigration and reliability in submicron metallization and multilevel interconnection
- - Thomas Kwok
- 1993
- Materials Chemistry and Physics
Thermal structural disorder and melting at a crystalline interface
- - Tue Nguyen
  - Paul S. Ho
  - et al.
- 1992
- Physical Review B
Electromigration in VLSI metallization (Invited Paper)
- - T. Kwok
- 1991
- SPIE Microelectronic Processing Integration 1991
Thermal stress-induced and electromigration-induced void-open failures in Al and Al-Cu fine lines
- - T. Kwok
  - K.K. Chan
  - et al.
- 1991
- Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
Electromigration in a two-level Al-Cu interconnection with W studs
- - T. Kwok
  - C. Tan
  - et al.
- 1990
- VMIC 1990
Grain-boundary melting transition in an atomistic simulation model
- - Tue Nguyen
  - Paul S. Ho
  - et al.
- 1986
- Physical Review Letters