Blistering effects in argon-bombarded silicon
- K. Wittmaack
- W. Wach
- 2008
- Applied Physics Letters
Paper
Publications
9 results for K. Wittmaack
System for combined SIMS-AES-XPS studies of solids
- M.A. Frisch
- W. Reuter
- et al.
- 2008
- Review of Scientific Instruments
PaperComparison of ion-excited Auger electron emission and secondary ion emission from silicon bombarded with noble gas ions
- K. Wittmaack
- 1980
- Nuclear Instruments and Methods
PaperAn AES-SIMS study of silicon oxidation induced by ion or electron bombardment
- W. Reuter
- K. Wittmaack
- 1980
- Applications of Surface Science
PaperSecondary-ion emission from silicon bombarded with atomic and molecular noble-gas ions
- K. Wittmaack
- 1979
- Surface Science
PaperProjectile-energy dependence and line shape of ArL Auger spectra from argon bombarded silicon
- K. Wittmaack
- 1979
- Physics Letters A
PaperIonization mechanism of H+ sputtered from hydrogenated silicon
- K. Wittmaack
- 1979
- Physical Review Letters
PaperCharacteristics of ion-excited silicon L-shell Auger spectra
- K. Wittmaack
- 1979
- Surface Science
PaperOn the mechanism of cluster emission in sputtering
- K. Wittmaack
- 1979
- Physics Letters A
Paper