E. Babich, J. Paraszczak, et al.
Microelectronic Engineering
Finite element methods were used to mode both the thermal and structural response of the PREVAIL prototype mask during exposure heating. Equivalent modeling techniques were used to simulate a variety of pattern density distributions. Temperature rises of 3.8 K were observed in membranes immediately after e-beam exposure. Errors in stitching in both horizontally and vertically adjacent subfields were determined.
E. Babich, J. Paraszczak, et al.
Microelectronic Engineering
I. Morgenstern, K.A. Müller, et al.
Physica B: Physics of Condensed Matter
Heinz Schmid, Hans Biebuyck, et al.
Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
I.K. Pour, D.J. Krajnovich, et al.
SPIE Optical Materials for High Average Power Lasers 1992