Joerg Appenzeller, R. Martel, et al.
IEEE Electron Device Letters
Paper
TEM and atom probe tomography characterization of high TMR MgO-based magnetic tunnel junctions
Abstract
No abstract available.
Related
R.F.C. Farrow, R.F. Marks, et al.
Journal of Applied Physics
Conference paper
TEM characterization for magnetic nano structure processing
P. Rice, R.E. Fontana, et al.
INTERMAG 2003
J.Z. Sun, L. Krusin-Elbaum, et al.
Applied Physics Letters