Compression for data archiving and backup revisited
Corneliu Constantinescu
SPIE Optical Engineering + Applications 2009
The nature of the interfacial roughness in Ni0.81Fe0.19/Au multilayers was studied using x-ray diffuse scattering. Using an image-plate detector this scattering could be observed to an extended momentum transfer. The roughness exponent and the cutoff length of the interfacial height-height self-correlation function could thereby be determined using a model of conformal roughness, for which the interfaces are smooth within the cutoff length. We also show that while the roughness is not conformal for short length scales, a transition to conformal behavior occurs from 25 to 100. © 1995 The American Physical Society.
Corneliu Constantinescu
SPIE Optical Engineering + Applications 2009
L.K. Wang, A. Acovic, et al.
MRS Spring Meeting 1993
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INFOS 2005
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