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PaperUse of photocurrent-voltage characteristics of MOS structures to determine insulator bulk trapped charge densities and centroidsD.J. DiMaria, Z.A. Weinberg, et al.Journal of Electronic Materials
PaperTrap creation in silicon dioxide produced by hot electronsD.J. DiMaria, J.W. StasiakJournal of Applied Physics
PaperOxide scaling limit for future logic and memory technologyJ.H. Stathis, D.J. DiMariaMicroelectronic Engineering
