PaperGraded or stepped energy band-gap-insulator MIS structures (GI-MIS or SI-MIS)D.J. DiMariaJournal of Applied Physics
PaperCharge trapping studies in SiO2 using high current injection from Si-rich SiO2 filmsD.J. DiMaria, R. Ghez, et al.Journal of Applied Physics
PaperHot-electron dynamics in SiO2 and the degradation of the Si/SiO2-interfaceE. Cartier, D.J. DiMariaMicroelectronic Engineering
PaperHole injection into silicon nitride: Dark current dependence on electrode materials and insulator thicknessP.C. Arnett, D.J. DiMariaApplied Physics Letters
