Joy Y. Cheng, Daniel P. Sanders, et al.
SPIE Advanced Lithography 2008
Paper
Surface Studies on Clean and Oxygen-Exposed GaAs and Ge Surfaces by Low-Energy Electron Loss Spectroscopy
Abstract
No abstract available.
Related
R. Ghez, J.S. Lew
Journal of Crystal Growth
Ming L. Yu
Physical Review B
J. Tersoff
Applied Surface Science