John G. Long, Peter C. Searson, et al.
JES
Structural investigations of the Co layer in Cu/Co/Cu/NiFe/FeMn spin valves have been performed by NMR. In addition to hcp stacking faults in an overall fcc structure, a significant amount of bulk defects, which may affect the magnetoresistance, is also present. The interface planes seem rather intermixed although they include some wide islands of pure elements. © 1993.
John G. Long, Peter C. Searson, et al.
JES
T.N. Morgan
Semiconductor Science and Technology
M.A. Lutz, R.M. Feenstra, et al.
Surface Science
Frank R. Libsch, Takatoshi Tsujimura
Active Matrix Liquid Crystal Displays Technology and Applications 1997