E. Babich, J. Paraszczak, et al.
Microelectronic Engineering
Structural investigations of the Co layer in Cu/Co/Cu/NiFe/FeMn spin valves have been performed by NMR. In addition to hcp stacking faults in an overall fcc structure, a significant amount of bulk defects, which may affect the magnetoresistance, is also present. The interface planes seem rather intermixed although they include some wide islands of pure elements. © 1993.
E. Babich, J. Paraszczak, et al.
Microelectronic Engineering
E. Burstein
Ferroelectrics
J. Paraszczak, J.M. Shaw, et al.
Micro and Nano Engineering
Zelek S. Herman, Robert F. Kirchner, et al.
Inorganic Chemistry