Synchrotron Radiation News

Paper

01 Jan 2004

Spectroscopic characterization of buried interfaces using soft X-ray standing waves

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Abstract

No abstract available.

Paper

Probing multilayer spintronic structures with photoelectron and x-ray emission spectroscopies excited by x-ray standing waves (invited)

S.-H. Yang, B.C. Sell, et al.

Journal of Applied Physics

Paper

Photoelectron peak intensities and atom/ion overlaps: An analysis of various approximations

M. Mehta, C.S. Fadley, et al.

Chemical Physics Letters

Paper

Determination of buried interface composition and magnetism profiles using standing-wave excited soft x-ray emission and inelastic scattering

B.C. Sell, S.B. Ritchey, et al.

Journal of Applied Physics

Paper

Probing multilayer spintronic structures with photoelectron and x-ray emission spectroscopies excited by x-ray standing waves (invited)

S.-H. Yang, B.C. Sell, et al.

Journal of Applied Physics

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