A. Gupta, R. Gross, et al.
SPIE Advances in Semiconductors and Superconductors 1990
Applying in situ combination of angle-resolved photoelectron spectroscopy and /<-resolved inverse photoemission to Si(100) XI and Si(100) surfaces, we have determined the surface band gaps between the Sb derived filled and empty surface states at several points of the surface Brillouin zone. The values of the surface band gaps are compared with optical surface excitations obtained by means of surface differential reflectivity. © 1994, American Vacuum Society. All rights reserved.
A. Gupta, R. Gross, et al.
SPIE Advances in Semiconductors and Superconductors 1990
Ming L. Yu
Physical Review B
Julian J. Hsieh
Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
P.C. Pattnaik, D.M. Newns
Physical Review B