F.F. Morehead
Journal of Physics and Chemistry of Solids
We present an analysis of gold diffusion profiles in silicon taking into account that both self-interstitials and vacancies are present at thermal equilibrium. We find that at 1000°C the contribution of self-interstitials to silicon self-diffusion is about equal to that of vacancies.
F.F. Morehead
Journal of Physics and Chemistry of Solids
R. Ghez, G.S. Oehrlein, et al.
Applied Physics Letters
F.F. Morehead
Physical Review B
U. Gösele, F.F. Morehead
Journal of Applied Physics