R. Ghez, G.S. Oehrlein, et al.
Applied Physics Letters
We present an analysis of gold diffusion profiles in silicon taking into account that both self-interstitials and vacancies are present at thermal equilibrium. We find that at 1000°C the contribution of self-interstitials to silicon self-diffusion is about equal to that of vacancies.
R. Ghez, G.S. Oehrlein, et al.
Applied Physics Letters
U. Gösele, F.F. Morehead, et al.
Applied Physics Letters
F.F. Morehead
JES
F.F. Morehead, B.L. Crowder, et al.
Journal of Applied Physics