W.A. Orr Arienzo, R. Glang, et al.
Journal of Applied Physics
We present an analysis of gold diffusion profiles in silicon taking into account that both self-interstitials and vacancies are present at thermal equilibrium. We find that at 1000°C the contribution of self-interstitials to silicon self-diffusion is about equal to that of vacancies.
W.A. Orr Arienzo, R. Glang, et al.
Journal of Applied Physics
R.T. Hodgson, V.R. Deline, et al.
MRS Proceedings 1983
F.F. Morehead, B.L. Crowder
Radiation Effects
M.G. Miksic, G. Mandel, et al.
Physics Letters