G. Will, N. Masciocchi, et al.
Zeitschrift fur Kristallographie - New Crystal Structures
The graphitelike model recently proposed by Jones and Holland for the structure of a laser-stabilized Si{111}1×1 surface is subjected to a new low-energy electron-diffraction (LEED) intensity analysis and compared to the relaxed-bulk model produced by earlier LEED analyses. Three different reliability factors applied to the normal-incidence data, and visual evaluation of non-normal-incidence data, discriminate unambiguously in favor of the relaxed-bulk model against the graphitelike model. © 1986 The American Physical Society.
G. Will, N. Masciocchi, et al.
Zeitschrift fur Kristallographie - New Crystal Structures
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SPIE Advanced Lithography 2007
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Small
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