Min Yang, Jeremy Schaub, et al.
Technical Digest-International Electron Devices Meeting
The graphitelike model recently proposed by Jones and Holland for the structure of a laser-stabilized Si{111}1×1 surface is subjected to a new low-energy electron-diffraction (LEED) intensity analysis and compared to the relaxed-bulk model produced by earlier LEED analyses. Three different reliability factors applied to the normal-incidence data, and visual evaluation of non-normal-incidence data, discriminate unambiguously in favor of the relaxed-bulk model against the graphitelike model. © 1986 The American Physical Society.
Min Yang, Jeremy Schaub, et al.
Technical Digest-International Electron Devices Meeting
K.A. Chao
Physical Review B
C.M. Brown, L. Cristofolini, et al.
Chemistry of Materials
J.Z. Sun
Journal of Applied Physics