S.I. Raider, J.R. Kirtley, et al.
Japanese Journal of Applied Physics
The structure of steps on cleaved silicon (111) surfaces is studied by scanning tunneling microscopy. Predominantly [21»1»] oriented steps are observed. Ordered regions of individual steps have unit periodicity along the step edge. A -bonded reconstruction of the step edge is deduced from the images. © 1987 The American Physical Society.
S.I. Raider, J.R. Kirtley, et al.
Japanese Journal of Applied Physics
J. Tersoff, R.M. Feenstra, et al.
Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
B.G. Briner, R.M. Feenstra, et al.
Semiconductor Science and Technology
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Physical Review Letters