J. Tersoff, R.M. Feenstra, et al.
Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
Paper
Reconstruction of steps on the Si(111)2×1 surface
Abstract
The structure of steps on cleaved silicon (111) surfaces is studied by scanning tunneling microscopy. Predominantly [21»1»] oriented steps are observed. Ordered regions of individual steps have unit periodicity along the step edge. A -bonded reconstruction of the step edge is deduced from the images. © 1987 The American Physical Society.
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