M.R. Melloch, J. Woodall, et al.
Annual Review of Materials Science
The structure of steps on cleaved silicon (111) surfaces is studied by scanning tunneling microscopy. Predominantly [21»1»] oriented steps are observed. Ordered regions of individual steps have unit periodicity along the step edge. A -bonded reconstruction of the step edge is deduced from the images. © 1987 The American Physical Society.
M.R. Melloch, J. Woodall, et al.
Annual Review of Materials Science
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MRS Bulletin
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