K.L. Kavanagh, M.A. Capano, et al.
Journal of Applied Physics
The structure of steps on cleaved silicon (111) surfaces is studied by scanning tunneling microscopy. Predominantly [21»1»] oriented steps are observed. Ordered regions of individual steps have unit periodicity along the step edge. A -bonded reconstruction of the step edge is deduced from the images. © 1987 The American Physical Society.
K.L. Kavanagh, M.A. Capano, et al.
Journal of Applied Physics
R.M. Feenstra, W.A. Thompson, et al.
Physical Review Letters
T.S. Kuan, P.E. Batson, et al.
IBM J. Res. Dev
R.M. Feenstra, E.T. Yu, et al.
Applied Physics Letters