Douglass S. Kalika, David W. Giles, et al.
Journal of Rheology
In a quantizing magnetic field, the resistance value of a two-dimensional electron gas between any well-resolved magnetic levels in any open geometry is given by multiple fractions of he2. Measurements in various geometrical configurations of Si(100) (metal-oxide-semiconductor) transistor yield a well-defined and accurate plateau of these values. © 1983 The American Physical Society.
Douglass S. Kalika, David W. Giles, et al.
Journal of Rheology
J. Tersoff
Applied Surface Science
David B. Mitzi
Journal of Materials Chemistry
Thomas H. Baum, Carl E. Larson, et al.
Journal of Organometallic Chemistry