R.D. Allen, Juliann Opitz, et al.
SPIE Advances in Resist Technology and Processing 1999
In addition to the high sensitivity, the use of photochemically generated acid as catalytic species has provided a basis for designing an entire family of advanced resist systems. The original chemical amplification scheme utilized 1) crosslinking through cationic ring-opening polymerization of pendant epoxide groups, 2) acid-catalyzed deprotection of polymer pendant groups to change the polarity for dual tone imaging, and 3) acid-catalyzed depolymerization of polyphthalaldehyde (PPA) to provide a self-developing positive resist (4). Each one of these design concepts has made a significant progress. This paper reports a recent progress in the positive PPA resist systems.
R.D. Allen, Juliann Opitz, et al.
SPIE Advances in Resist Technology and Processing 1999
A.T.S. Pomerene, K.E. Petrillo, et al.
Microlithography 1994
Hiroshi Ito, G. Breyta, et al.
Microlithography 1995
W.D. Hinsberg, Scott A. MacDonald, et al.
Microlithography 1993