Conference paper
Reliability and yield: A joint defect-oriented approach
Roman Barsky, Israel A. Wagner
DFT 2004
No abstract available.
Roman Barsky, Israel A. Wagner
DFT 2004
Israel A. Wagner, Alfred M. Bruckstein
CEC 1999
David Goren, Michael Zelikson, et al.
DATE 2002
Israel A. Wagner, Michael Lindenbaum, et al.
IEEE Transactions on Robotics and Automation